System reliability, models of reliability, the terminology and modeling of errors in digital systems, the ‘’stuck-at’’ error model, digital system testing for error detection, error simulation in digital systems, the off-line and on-line testing concept, the automatic test pattern generation (ATPG), the design-for-test (DFT), the built-in self test (BIST), error detection and correction codes, algorithm-based fault tolerance, error tolerance, hardware, informational, temporal, software redundancy, the design of digital systems with self-testing options, design of fault tolerant systems for digital signal processing, advanced techniques in fault tolerant system design, fault tolerant reconfigurable systems, cellular automata systems, embrionics systems.