Characterization and testing of electronic components (resistors, condensers, inductors, filters, amplifiers). Wafer measurement using the Wafer Probe Station. Measuring of s/z/y parameters, the Q-factor measuring, the reflection/transmission coefficient measurement. Practical work with the Vector Network Analyzer up to high frequencies resulting in special effects. Calibration during the course of measurement. Material parameter measuring (permittivity, permeablity) using the Impendance Analyzer. Observing the internal structure of materials by using different microscopic techniques. The acquired data analysis and presentation. The overview of the most recent advancements in this field by reading scientific articles and journals. A part of the curriculum is carried out through individual study research work in the field of Electronic Component and Material Characterization. The study research work involves active reading of primary scientific sources, the organization and realization of experiments and statistical data processing, numerical simulations and writing a research paper in the specific scientific field to which the approved doctoral thesis relates to.