Acquiring practical knowledge in the field of characterization and testing of microelectronic circuits, experiments with measurement instruments in the field of microelectronics.

- ability to record characteristics of semi-conductor components using the curve tracers - ability to practically test passive components (resistors, capacitors, inductors) - ability to measure s/z/y-parameters, microelectronic components using the Vector Network Analyzer - ability to monitor special effects on silicon wafer using the Wafer Probe Station

Introduction. Methods for testing microelectronic components and circuits. Recording characteristics of semi-conductor components (diodes, Zener diodes, transistors, MOSFET). Practical work with the tracer Tektronix Curve Tracer (type 576). Characterization and testing of passive components (resistors, capacitors, inductors). Practical work with HP 4277A LCZ meter. Measurement of s/z/y parameters, measurement of Q-factor, measurement of reflection/transmission coefficient. Practical work with the Vector Network Analyzer Agilent E5071B. Measurement on wafer. Practical work with Wafer Probe Station. Monitoring special effects on the chip using a microscope.

Lectures; Auditory Practice; Computer Practice; Laboratory Practice; Consultations.